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Jin-Fu Li received BS degree in 1995 from Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan, and the MS and PhD degrees, both in Department of Electrical Engineering, in 1999 and 2002, respectively, from National Tsing Hua University, Hsinchu, Taiwan. Since 2002 he has been with the Department of Electrical Engineering, National Central University, Jhongli, Taiwan, where he is currently a full Professor and Chairman. From July 2006 to May 2007, he also was a Visiting Scholar with the Electrical and Computer Engineering Department, University of California, Santa Barbara (UCSB), where he joined the system-on-a-chip (SOC) Design and Test Laboratory supervised by Prof. K.-T. (Tim) Cheng. He served as an Associate Chairman of the Department of Electrical Engineering, NCU from August 2010 to July 2013. His research interests include advanced VLSI/SOC design and test, memory testing and repair, reliable VLSI circuits and systems, and 3-D IC architecture design and test.

Dr. Li was a recipient of the Industry Academy Collaboration Award from Taiwan Ministry of Education (MOE) in 2003, the PhD Thesis Award from Taiwan IC Design (TICD) Society in 2003, the Taiwan Merit Scholarship from the University-Based Program of MOE in 2005, the Best Mentor Teacher Award from National Central University (NCU) in 2008 and 2011, the College-Level Distinguished Teaching Award from NCU in 2011, the Outstanding Research Award from NCU from 2008 to 2013, the Excellent Young Electrical Engineer Award from the Chinese Institute of Electrical Engineering, Taiwan, in 2008, the Distinguished Young Scholar Award from the TICD Society in 2010, the 2013 IEEE VLSI Test Syposium Best Special Session Award from TTTC, IEEE Computer Society, the Distinguished Outstanding Faculty Award of Electrical Engineering from the Chinese Institute of Electrical Engineering, Taiwan, in 2015. He has served the organization or technical program committees of several IEEE conferences. He is the Track Chair of testing technology of IEEE Asia Pacific Conference on Circuits and Systems 2012 and 2014. He is the co-chair of 2014 ICCAD CAD Contest. He is the Program Chair and General Chair of the VLSI Test Technology Workshop (VTTW), Taiwan, in 2010 and 2011, respectively. He is the Program Chair of the 2013 VLSI/CAD Symposium, Taiwan. Since 2015, he is an Assoicate Editor of IEEE Design & Test. He is a member of the IEEE and the IEEE Computer Society. He is also a life member of Chinese Institute of Electrical Engineering and TICD Society.