EE 6083 VLSI Testing

Jin-Fu Li

jfli@ee.ncu.edu.tw

Fall 2013

Reference Books

1. Cheng-Wen Wu, "Slides of VLSI Testing I",http://larc.ee.nthu.edu.tw/~cww/.
2. L.-T. Wang, C.-W. Wu, and X. Wen,"VLSI Test Principles and Architectures", Elsevier, 2006.
3. Bushnell and Agrawal,"Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI Circuits",Kluwer Academic Pubishers, 2000.
4. Abramovici, Breuer, & Friedman,"Digital Systems Testing and Testable Design", Revised Printing, IEEE Press, 1995 (IEEE Order No. PC4186, ISBN 0-7803-1062-4).

Transparencies

You can download the lectures slides from the blackboard system.

Homeworks

You can download the pdf files from the blackboard system.

Statistics

Grading:

1. Homework 30%
2. (Midterm+Final) 70%

Midterm:10:00-12:00, Thur., Nov. 14, E1-019

Final:10:00-12:00, Thur., Jan 16, E1-019