|
|
||||
|
|
|
高頻測量設備 •
On wafer (6-inch) GSG measurement for Lateral devices: HEMT,
HBT, diode, and others •
I-V, [s] measurement, pulse I-V (B1530A WGFMU/B1525A High Voltage
SPGU ) •
E5063A ENA Series Network Analyzer: 2-port 100K to 18 GHz •
變溫系統: 25 - 300 °C •
Bias-T capability •
Auriga BT0110-50 (3
A, 50 W, 100 V, 0.1-10 GHz) •
Auriga BT1026-1 (2
A, 1 W, 150 V, 0.1-26.5 GHz) •
Agilent 11612V K11
(2A, 2 W, 40 V, 45 M-50 GHz) 中電壓/中電流測量設備B1500A •
CASCADE MICROTECH / ALESSI REL 4800 •
On wafer (8-inch) measurement for Lateral devices Kelvin probe
tip: HEMT, HBT, diode, and others •
I-V, C-V: 200 V capability, 1 A capability •
變溫系統: 25 - 300 °C 中電壓/中電流測量設備B1500A安裝模組 •
B1525A High Voltage SPGU
(semiconductor pulse generator unit) •
B1520A MFCMU Multi
Frequency CMU •
B1511A MPSMU Medium
Power SMU ´ 4 組 •
B1510A HPSMU High Power SMU •
B1530A WGFMU
waveform generator/fast measurement unit 高電壓/高電流測量設備B1505A系統 •
Formfctor Cascade Testa T200M-STA-M probe station •
On wafer (8-inch) device measurements
Vertical
transistors (IGBT, MOSFET), diodes (PIN diode, Schottky diode)
Lateral transistor, diodes (GaN HEMT, GaAs HEMT/HNT), •
I-V, C-V, pulse I-V, dynamic Ron,
Gate Charge •
3000 V capability •
40A (on wafer), 1500 A / 60 V (Pulsed, PAckage/Module) •
變溫系統: 20 - 300 °C •
Package devices •
Chuck plugs •
CascadeMicrotech Floating Plug 149-976 (10 kV) •
CascadeMicrotech Shorting Plug 149-977 (10 A/60 A pulse) •
CascadeMicrotech SHV 149-981 (5000 V/2 A) •
CascadeMicrotech HV TRIAX 153-180 (3000 V/40 A) •
CascadeMicrotech BNC 151-256 (500 V/ 5 A, 30A pulse) •
CascadeMicrotech HV TRIAX 149-978 (3000V/2A) 高電壓/高電流測量設備B1505A安裝模組 • B1513B HVSMU High Voltage SMU; 1500 V/8 mA; 3000 V/4 mA; (Pulsed &
DC) • B1512A HCSMU High Current SMU ´ 2 模組: 20 A/20 V (Pulsed); 1 A/40 V
(DC) •
B1514A MCSMU Medium Current SMU ´
2: 1 A/30 V
(Pulsed); 100 mA/30 V (DC) •
B1520A MFCMU Multi
Frequency CMU •
B1510A HPSMU High Power
SMU •
N1265A Ultra High Current Expander/Fixture: •
N1267A: HVSMU/HCSMU
Fast Switch: Dynamic
Ron measurement •
N1274A On-Wafer Gate Charge Measurement Adapter/Selector for
20 A/3 kV •
N1258A module selector •
N1259A: Test fixture for packaged device measurements •
N1265AU Ultra High Current Expander/Fixture: 1500 A / 60 V (Pulsed), •
N1265A (N1259A) Opt 014 Gate Charge
Socket Adaptor •
N1271A/Opt 001 Thermal
plate (250 °C) •
N1272A/1273A Device
Capacitance selector PD1500A Series Dynamic Power Device
Analyzer/Double-Pulse Tester •
Discrete IGBT, SiC, and GaN devices •
Characterize 650 V, 1.2 kV, and 1.7 kV-rated discrete devices •
Current up to 200 A •
Turn-On Characteristics •
Turn-Off Characteristics •
Switching Characteristics •
Reverse Recovery •
Gate Charge •
Dynamic Ron E4990A Impedance Analyzer & N1500A (Electromagnetic
Properties Characterization) •
DC parameter: ±40 V, 100 mA. 1 mV resolution, 40 μA resolution •
Frequency Range: E4990A-120 (20 Hz to 120 MHz) 1 mHz
resolution •
42942A: Terminal adapter kit for impedance
analyzer •
16454A: Magnetic
Material Test Fixture (1 KHz to 1 GHz) •
16451B: Dielectric material test fixture (20 Hz to 30 MHz):
Dielectric constant Auriga Pulse AU5 & Pulser Head
(Pulse I-V Characteristics) •
On-wafer measurement and package devices. •
PHG100: Gate Pulser Head, ±100V, 2A Pulsed, 100mA DC, 40W •
PHD1200-10: Drain Pulser Head, 1200 V, 10A Pulsed, 0.1A DC, 1000 W •
PHD3000-HVK: High-voltage filter kit for 1200 V Pulser head
series •
AU-3R100-LCF(U): DC high voltage power supply |
|
|
